RoBAT HTR

Additional information

Fault Coverage

Test Functions

TDR High Speed SI Test

TDT High Speed SI Test

VNA High Speed SI Test

Board Type

1- Single Sided Only
2 - Using TDR/VNA Measurement (depends on board architecture)

Manual or semi-automatic operation
Available with two test heads
Test heads available with either 2 port integrated TDR units or single port integrated VNA units
High specification, ultra-compact TDR units:
12ps rise time
35 GHz bandwidth
1ps time base
High specification, ultra-compact 1MHz – 43.5 GHz VNA units
Test probes can be connected into customer’s existing TDR or VNA units
Suitable for all high-speed bare boards and boards with assembled digital devices
1µ encoders fitted to X and Y axes
Micro adjustments of 5µ for extremely accurate alignment of test module to PCB
Each test XY position can be recorded to enable the operator to return to the exact same location on a subsequent board. Ideal for batch testing
Software will guide the operator to each recorded XY position
Motorised axes available for semi-automatic operation
Full range of TDR & VNA tests and measurements available; Single-ended and differential Impedance, Skew, Backdrill discrepancies
Adjustable pitch signal to ground probe modules
Customised two channel modules available
X and Y axis brakes to prevent probe/PCB damage